Automated Test Equipment (ATE) is an apparatus that uses automation to perform test on various units under test (UUTs) or devices under test (DUTs) to perform measurement and quickly evaluate the results. An ATE ranges from a simple digital multimeter to complex test instruments. ATE is capable of automatically diagnosing and testing faults in wafer testing, integrated circuits, system on chips and electronic packaged parts. ATE is extensively used in electronic manufacturing industry in order to test systems and electronic components for defects throughout the manufacturing process to ensure that end product functions correctly.
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Integrated circuits on a wafer have to be tested prior to die preparation and this makes automated test equipment extremely vital for semiconductor manufacturing. The success of tablets, PDAs has created a demand of greater functionality in terms of higher speeds, performance, and pin counts in products. The world semiconductor ATE market is expected to see a growth driven by the demand for system-on-chip (SoC) products in smart phones, communication devices and consumer electronic products.
The key objective of Automated Test Equipment (ATE) is to swiftly find the defects in a DUT and confirm whether a device under test (DUT) works correctly. This method saves manufacturing costs and helps prevent faulty devices to enter the market. ATE is used for a group of DUTs, with different testing procedures. Authenticity in all testing is that testing fails and DUT fails the evaluation once the first out-of-tolerance value is detected.
The key factors driving the demand for ATE include increase in the production of semiconductor devices, increase in the complexity and required performance level of semiconductors used in consumer electronic products and the emergence of next generation devices and technologies associated with these devices. The rapid transition to a 28 nm node application processor manufacturing process will fuel the demand for IC testing equipment, which in turn will drive the growth of the ATE.
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